Atomic Force Microscopy (AFM) is a method used to capture topographical images of a desired area within the micro or nanoscale range by using a probe tip on a cantilever that is only a few nanometers thick. This cantilever will travel across the sample, and the changes in its height as it encounters different structures will be recorded and displayed accordingly. While the miniscule tips make AFM useful for accurately imaging designs and structures as small as the nanoscale, for the same reason it has disadvantages when used to fabricate nanostructures. The probe is so miniscule, using it as an etching tool leaves barely noticeable marks on the surface, where the width of the etchings is dependent on the size of the tip, and causes the probe to wear down quickly because of the amount of force applied between it and the sample. A new method of using AFM as a nanofabrication method involves rotating the sample in a circular motion using piezoelectric vibrations in both the X and Y direction. The circular motion of the sample allows the tip to carve out circular areas of the sample, allowing control over the width of the etchings based on the magnitude of the piezoelectric vibrations. This study focuses on the creation of 3-dimensional images using this nanofabrication method based on the use of varying shades of black and white within the base image inputted to the AFM’s program.